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  • MDLSoft will be participating at the EDTM in Kobe, Japan (March 12-15, 2018) as exhibitor and speaker (presenting a paper on “Defect spectroscopy from electrical measurements: a simulation-based technique.” In this paper we will present a Ginestra™-based defect spectroscopy technique for extracting defect and material properties of gate oxides and dielectrics).

    MDLSoft will be participating at the EDTM in Kobe, Japan (March 12-15, 2018) as exhibitor and speaker (presenting a paper on “Defect spectroscopy from electrical measurements: a simulation-based technique.” In this paper we will present a Ginestra™-based defect spectroscopy technique for extracting defect and material properties of gate oxides and dielectrics).

  • IRPS 2018   to feature paper  “ Time-dependent Dielectric Breakdown Statistics in SiO2 and HfO2 Dielectrics: Insights from a Multi-Scale Modeling Approach.” By Andrea Padovani and Luca Larcher of MDLSoft.

    IRPS 2018 to feature paper “ Time-dependent Dielectric Breakdown Statistics in SiO2 and HfO2 Dielectrics: Insights from a Multi-Scale Modeling Approach.” By Andrea Padovani and Luca Larcher of MDLSoft.

    In this paper the authors use physics-based breakdown simulations to investigate the time dependent dielectric breakdown (TDDB) distributions of SiO2 and HfO2 stacks. They show that the low thickness-independent TDDB Weibull slope (b) measured in HfO2 originates from the high intrinsic density and spatially correlated defect generation process. They prove also that the double slope observed in TDDB distributions of IL-HfOx stacks is also related to the stochastic nature of the bond breakage process in SiO2 and HfO2.

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  • MDLSoft participated in IEDM 2017 conference as exhibitor and speaker (presented paper on “Multiscale modeling of neuromorphic computing devices : from materials to device operations ”) received an overwhelming response to their multiscale solution platform Ginestra™

    MDLSoft participated in IEDM 2017 conference as exhibitor and speaker (presented paper on “Multiscale modeling of neuromorphic computing devices : from materials to device operations ”) received an overwhelming response to their multiscale solution platform Ginestra™

  • Dipu Pramanik presented paper on

    Dipu Pramanik presented paper on"Accurate prediction of device reliability from fundamental properties of point defects in dielectric stacks" at the IIRW conference (Oct 8-12,2017) at Lake Tahoe, CA

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  • Accurate prediction of device reliability from fundamental properties of point defects in dielectric stacks

    Accurate prediction of device reliability from fundamental properties of point defects in dielectric stacks

    Dipu Pramanik

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  • A microscopic mechanism of dielectric breakdown in SiO2 films: An insight from multi-scale modeling

    A microscopic mechanism of dielectric breakdown in SiO2 films: An insight from multi-scale modeling

    Padovani A., Gao D.Z., Shluger A.L., Larcher L., 2017

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  • Random telegraph noise in HfOx Resistive Random Access Memory: From physics to compact modelling

    Random telegraph noise in HfOx Resistive Random Access Memory: From physics to compact modelling

    Puglisi F.M., Pavan P., Larcher L, 2016

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  • Anomalous random telegraph noise and temporary phenomena in resistive random access memory

    Anomalous random telegraph noise and temporary phenomena in resistive random access memory

    Puglisi F.M., Larcher L., Padovani A., Pavan P., 2016

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