Ginestra™ 3D: New FEM-based approach for arbitrary 3D geometries

  • Finite Element and Finite Volume

  • Highest accuracy through hexahedral mesh with local refinement capabilities

  • Tunneling and quantization effects

  • Individual defects considered

  • 3D templates: FinFET, 3D CTT NAND, DRAM,..


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Understand how defect-related issues affect performance, variability and reliability of state-of-the art logic and memory technologies